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May 21-23, 2001 (Monday-Wednesday)
Budapest, Hungary
Budapest Convention Centre

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IMTC/2001: Overview of Main Lectures

Keynote Lecture

George S. Springer, Department of Aeronautics and Astronautics, Stanford University, USA
How to Make Dumb Sensors Smart: Fiber Optic Sensors in Smart Structures Abstract

State-of-the-Art Lectures


Mike Gard, Subsite Electronics, Perry, Oklahoma, USA  email
A Status Report on Environmental Monitoring Abstract


Sergios Theodoridis, Department of Informatics, University of Athens, Greece
Adaptive Signal Processing for Measurement Abstract

Charles Tóth, Center for Mapping, Ohio State University, USA
Sensor Integration in Airborne Mapping Abstract

Adriaan van den Bos, Signals, Systems and Control Group, Delft University of Technology, The Netherlands
Resolution in Model Based Measurement Abstract


Madhavan Swaminathan*, Woopoung Kim*, and István Novák** email,
*GeorgiaTech, USA
**SUN Microsystems, USA
Measurement Problems of High-Speed Networks Abstract

Reiner Thomä, Dirk Hampicke, Andreas Richter, and Gerd Sommerkorn, Fakultät für Elektrotechnik und Informationstechnik, Technische Universität Ilmenau, Germany  email
Measurement and Identification of Mobile Radio Propagation Channels  Abstract


Uwe Kiencke, Universität Karlsruhe (TH), Institut für Industrielle Informationstechnik, Germany
Future Perspectives of Automotive Control Abstract

Paul M. J. Van den Hof, Signals, Systems and Control Group, Delft University of Technology, The Netherlands
Identification of Experimental Models for Control Design Abstract


Lennart Ljung, Department of Electrical Engineering, Linköping University, Sweden
Black-box Models from Input-output Measurements Abstract

Johan Schoukens*, T. Dobrowiecki**, and R. Pintelon*,
* Department ELEC, Vrije Universiteit Brussel, Belgium
** DMIS, Budapest University of Technology and Economics, Hungary
Linear Modeling in the Presence of Nonlinear Distortions Abstract

Herman Van der Auweraer, LMS International, Belgium  email
Structural Dynamics Modeling Using Modal Analysis: Applications, Trends and Challenges  Abstract

Johan Suykens, Katholieke Universiteit Leuven, Belgium
Nonlinear Modeling and Support Vector Machines  Abstract


Edward A. Lee, Department of Electrical Engineering and Computer Science, University of California, Berkeley, USA
Computing for Embedded Systems Abstract

Andreas A. Linninger, Department of Chemical Engineering, University of Illinois at Chicago, USA
Recent Advances in Process Systems Engineering Abstract

János Sztipánovits, Vanderbilt University, USA
Advances in Model-Integrated Computing Abstract


Kang Lee, National Institute of Standards & Technology, USA  email
Sensor Networking and Interface Standardization Abstract

Edward W. Taylor, University of New Mexico, USA  email
Inorganic and Polymer Photonic Sensor Technologies in Space Missions Abstract

Mel Siegel, Measurement and Control Lab, Carnegie Mellon University, USA
Smart Sensors and Small Robots Abstract

Hans-Rolf Tränkler, Institut für Meß- und Automatisierungstechnik, Universität der Bundeswehr München, Germany
Recent Advances in Sensor Technology Abstract


Robert Gao, Department of Mechanical and Industrial Engineering, University of Massachusetts at Amherst, USA
BIT for Intelligent System Design and Condition Monitoring Abstract

Thomas Linnenbrink, Q-DOT, Inc., USA email, Steven Tilden, Texas Instruments, Inc., USA, and Martin Miller, LeCroy SA, Switzerland
ADC Testing with IEEE Std 1241-2000 Abstract

Gerd Vandersteen, Imec, Belgium
Identification Techniques for ADC Testing and Characterization  Abstract

List last edited: March 13, 2001.

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